DYTEST: A Self-learning Algorithm Using Dynamic Testability Heasures to Accelerate Test Generation
نویسنده
چکیده
This paper presents a self-learning algorithm using a dynamic testability measure to accelerate test generation. It also introduces the concepts o f full logic value label backward implication, the dependent backtrack and K-limited backtracks. Results indicating a high fault coverage are also presented for ten benchmark combinational circuits.
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تاریخ انتشار 2004